Your selections:
Adaptive scan for atomic force microscopy based on online optimization: theory and experiment
- Wang, Kaixiang, Ruppert, Michael G., Manzie, Chris, Nesic, Dragan, Yong, Yuen Kuan
Scan rate adaptation for AFM imaging based on performance metric optimization
- Wang, Kaixiang, Ruppert, Michael G., Manzie, Chris, Nešić, Dragan, Yong, Yuen Kuan
Position and force sensing using strain gauges integrated into piezoelectric bender electrodes
- Seethaler, Rudolf, Mansour, Sepehr Zarif, Ruppert, Michael G., Fleming, Andrew J.
- Seethaler, Rudolf, Mansour, Sepehr Zarif, Ruppert, Michael G., Fleming, Andrew J.
Dynamics and control of active microcantilevers
- Ruppert, Michael G., Moheimani, S. O.
Active atomic force microscope cantilevers with integrated device layer piezoresistive sensors
- Ruppert, Michael G., Fleming, Andrew J., Yong, Yuen K.
A Kalman filter for amplitude estimation in high-speed dynamic mode atomic force microscopy
- Ruppert, Michael G., Karvinen, Kai S., Wiggins, Samuel L., Moheimani, S. O. Reza
Multi-mode resonant control of a microcantilever for atomic force microscopy
- Ruppert, Michael G., Fairbairn, Matthew W., Moheimani, S. O. Reza
State estimation for high-speed multifrequency atomic force microscopy
- Ruppert, Michael G., Harcombe, David M., Reza Moheimani, S. O.
A review of demodulation techniques for amplitude-modulation atomic force microscopy
- Ruppert, Michael G., Harcombe, David M., Ragazzon, Michael R. P., Moheimani, S. O. Reza, Fleming, Andrew J.
High-bandwidth demodulation in MF-AFM: a Kalman filtering approach
- Ruppert, Michael G., Harcombe, David M., Moheimani, S. O. Reza
On-chip dynamic mode atomic force microscopy: a silicon-on-insulator MEMS approach
- Ruppert, Michael G., Fowler, Anthony G., Maroufi, Mohammad, Moheimani, S. O. Reza
High-bandwidth multimode self-sensing in bimodal atomic force microscopy
- Ruppert, Michael G., Moheimani, S. O. Reza
Frequency domain analysis of robust demodulators for high-speed atomic force microscopy
- Ruppert, Michael G., Harcombe, David M., Ragazzon, Michael R. P., Moheimani, S. O. Reza, Fleming, Andrew J.
Multimode Q control in tapping-mode AFM: enabling imaging on higher flexural eigenmodes
- Ruppert, Michael G., Moheimani, S. O. Reza
Characterization of active microcantilevers using laser doppler vibrometry
- Ruppert, Michael G., Franco Soares De Bem, Natã, Fleming, Andrew J., Yong, Yuen K.
A novel self-sensing technique for tapping-mode atomic force microscopy
- Ruppert, Michael G., Moheimani, S. O. Reza
Novel reciprocal self-sensing techniques for tapping-mode atomic force microscopy
- Ruppert, Michael G., Moheimani, S. O. Reza
Multimodal atomic force microscopy with optimized higher eigenmode sensitivity using on-chip piezoelectric actuation and sensing
- Ruppert, Michael G., Moore, Steven I., Zawierta, Michal, Fleming, Andrew J., Putrino, Gino, Yong, Yuen K.
Note: Guaranteed collocated multimode control of an atomic force microscope cantilever using on-chip piezoelectric actuation and sensing
- Ruppert, Michael G., Yong, Yuen K.
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